The defense community in Maryland is an R&D powerhouse. Use this database to see the innovative patents that are poised for commercialization.Data is provided by DoD Naval labs in Southern Maryland. Database funding supported by the DoD Office of Economic Adjustment through a Defense Industry Adjustment grant program.
|Abstract||A method is provided for determining a thickness L of a chiral slab that refracts incident linearly polarized light into right (+) and left (−) circularly polarized beams. The method includes disposing the slab in an achiral medium, determining values of translation coefficients γ±, determining values for refraction angle differences (θ+−θ−), selecting pre- and post selection states |ψi and |ψj, projecting an emitted light beam through said achiral medium into the chiral slab a small established angle of incidence θ0, varying slab egress phase angles β±, determining said pointer mean value x, calculating weak value Aw, and calculating the thickness as L = 〈 x 〉 Re A w . The achiral medium has an established index of refraction n0. The translation coefficients γ± establish refraction translation differences (γ+−γ−). The pre-selection state |ψi establishes pre-selection alignment angle to satisfy Φ=π/4. The post-selection state |ψj establishes post-selection alignment angle to satisfy χ=Φ−ε and 0<ε<<1. The slab egress phase angles β± are adjusted until pointer mean value x attains one of a maximum for (γ+−γ−)>0 or else a minimum for (γ+−γ−)<0. In various exemplary embodiments, the weak value is approximated as A w ≈ γ + - γ - + 2 ɛ γ - 2 sin ɛ ≈ γ + - γ - 2 ε .|
|Patent Number||8,902,436||Issue Date||2014-12-02||Link USPTO website|
This patent was granted in 3 years, 159 days, which is a slower than average speed.
It has 16 claims, which is far fewer than average for this category.
Its proximity to basic research is much less than others in this category, and it displays a much slower than average technology cycle time.
This patent received far fewer citations from other patents, and references far fewer other patents, as compared to other patents in this category.
This patent had a slower than average grant time compared to others in this category.
Patent grant time can be influenced by many factors. Activities within the USPTO that are beyond the control of patent attornies can influence grant time, but short grant times can also indicate well-written patents and dedicated efforts to respond rapidly to USPTO office actions with strong arguments. Shorter grant times are preferable, and the scores for this section are inverse measures — higher scores are better.
This patent has far fewer claims compared to others in this category.
The number of claims in a patent is correlated with its strength. Because greater claim counts increase the cost of a patent, more claims can indicate the importance an applicant assigns to a patent. Importantly, some may elect to file claims across multiple patents. A higher score in this metric indicates more claims, relative to others in this category.
This patent has received far fewer citations from other patents, than others in this category.
Citations from other patents are an important measure of the significance of a patent. More citations indicate that other technologies build on a patent. Higher scores in this metric are better, and indicate more citations from other patents.
This patent referenced many more citations to other patents, than others in this category.
A lower number of citations to other patents can be a sign of diminished patent strength. More citations indicate dependence on more other technologies. Higher scores in this category are better, and indicate fewer citations to other patents.
This patent has much less proximity to basic research compared to others in this category.
Proximity to basic research is measured by comparing the number of citations to non-patent literature among a cohort of patents. Because most non-patent citations are primary research papers, a higher count indicates greater proximity to basic research.